|
Bad Moods Boost Memory and Judgement
Being in a bad mood may not be all gloom and doom after Australian
scientists found that negative feelings improved judgement, boosted
memory and made people less gullible.
The study, authored by psychology professor Joseph Forgas at
the University of New South Wales, showed that people in a bad
mood were more critical of, and paid more attention to, their
surroundings than happier people, who were more likely to believe
anything they were told.
"Whereas positive mood seems to promote creativity, flexibility,
cooperation, and reliance on mental shortcuts, negative moods
trigger more attentive, careful thinking paying greater attention
to the external world," Prof Forgas wrote.
"Our research suggests that sadness ... promotes information
processing strategies best suited to dealing with more demanding
situations."
The team of researchers conducted several experiments that started
with inducing happy or sad moods in their subjects through watching
films and recalling positive or negative events.
In one of the experiments, happy and sad participants were asked
to judge the truth of urban myths and rumours. the results showed
that people in a negative mood were less likely to believe these
statements.
People in a bad mood were also less likely to make snap decisions
based on racial or religious prejudices, and they were less likely
to make mistakes when asked to recall an event that they witnessed.
The study also found that sad people were better at stating their
case through written arguments, which Prof Forgas said showed
that a "mildly negative mood may actually promote a more
concrete, accommodative and ultimately more successful communication
style."
"Positive mood is not universally desirable: people in negative
mood are less prone to judgmental errors, are more resistant to
eyewitness distortions and are better at producing high-quality,
effective persuasive messages," he wrote.
The study was published in the November/December edition of the
Australasian Science journal.
Reference
Source 172
November 3, 2009
|